期刊簡介預(yù)計(jì)審稿時間：

IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.

《IEEE 設(shè)計(jì)與測試》提供原創(chuàng)作品，介紹用于設(shè)計(jì)和測試微電子系統(tǒng)（從設(shè)備和電路到完整的片上系統(tǒng)和嵌入式軟件）的模型、方法和工具。該雜志側(cè)重于當(dāng)前和近期的實(shí)踐，包括教程、操作方法文章和真實(shí)案例研究。該雜志力求通過專欄、訪談和圓桌討論，向讀者介紹重要的技術(shù)進(jìn)步以及技術(shù)領(lǐng)導(dǎo)者的觀點(diǎn)。主題包括半導(dǎo)體 IC 設(shè)計(jì)、半導(dǎo)體知識產(chǎn)權(quán)模塊、設(shè)計(jì)、驗(yàn)證和測試技術(shù)、制造和產(chǎn)量設(shè)計(jì)、嵌入式軟件和系統(tǒng)、低功耗和節(jié)能設(shè)計(jì)、電子設(shè)計(jì)自動化工具、實(shí)用技術(shù)和標(biāo)準(zhǔn)。

《Ieee Design & Test》(IEEE設(shè)計(jì)與測試)編輯部通訊方式為445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141。如果您需要協(xié)助投稿或潤稿服務(wù)，您可以咨詢我們的客服老師。我們專注于期刊咨詢服務(wù)十年，熟悉發(fā)表政策，可為您提供一對一投稿指導(dǎo)，避免您在投稿時頻繁碰壁，節(jié)省您的寶貴時間，有效提升發(fā)表機(jī)率，確保SCI檢索（檢索不了全額退款）。我們視信譽(yù)為生命，多方面確保文章安全保密，在任何情況下都不會泄露您的個人信息或稿件內(nèi)容。